Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Reiner R. Dumke, René Braungarten, Günter Büren, Alain Abran, Juan J. Cuadrado-Gallego.

Hutchison, David. (author)

Abran, Alain. (author)

Braungarten, René. (author)

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Büren, Günter. (author)

Cuadrado-Gallego, Juan J. (author)

Dumke, Reiner R. (author)

Kanade, Takeo. (author)

Kittler, Josef. (author)

Kleinberg, Jon M. (author)

Mattern, Friedemann. (author)

Mitchell, John C. (author)

Naor, Moni. (author)

Nierstrasz, Oscar. (author)

Pandu Rangan, C. (author)

Steffen, Bernhard. (author)

Sudan, Madhu. (author)

Terzopoulos, Demetri. (author)

Tygar, Doug. (author)

Vardi, Moshe Y. (author)

Weikum, Gerhard. (author)

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ISBN 9783540894032

Berlin, Heidelberg : Springer Berlin Heidelberg, 2008

English

Series: Lecture Notes in Computer Science, 0302-9743 ; 5338

Related links:

http://dx.doi.org/10... (Table of Contents / Abstracts) (856other)

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